Joining Forces at Control 2017

It was great to team up with our new colleagues (the former PerkinElmer Imaging team) at Control 2017 in Stuttgart, Germany for our first trade show together as Varex Imaging. We were excited to be introducing our new products to this international gathering of leading service providers, equipment developers, and research institutes working in the Industrial Inspection sector.

At this show, we showcased a variety of flat panel detectors and introduced three products:

1. Dexela® 2315NDT
2. XRD 4343CT
3. XRD 3025

Our CMOS Dexela® 2315NDT: a high speed, low noise detector with a 75 µm pixel size that employs large-area CMOS image sensor technology. Its large Field of View (FOV) enables geometric magnification. Key applications of this detector include: electronics inspection, casting and weld/pipeline inspection, metrology, industrial cone beam computed tomography (CT), materials science, and quality control for automotive, aerospace and electronics manufacturing.

The XRD 4343CT: based on our next generation platform of Amorphous Silicon (a-Si) technology, supports a full 43 cm × 43 cm FOV, has a 150 µm pixel size and fast frame rate. Its applications include low-dose NDT, 3D cone beam CT, metrology and scientific research.

The XRD 3025: provides high resolution with 100 µm pixel size and supports a broad range of X-ray energies across real time and static imaging. In addition to industrial NDT, its applications include 3D cone beam CT, metrology and life science and physical science research.

It’s an exciting time to be teaming up with PerkinElmer Imaging to provide a broader portfolio of innovative technologies supporting a wide range of highly sophisticated NDT applications. For more industrial flat panel information, click here.